| Characteristics |
Specifications |
Test methods |
DC
resistance
(JIS-C-5202 5.1) |
J (+5%) |
Resistance value test at room temperature 25°C |
Temperature coefficient
(JIS-C-5202 5.2) |
+350 PPM/°C |
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| R2-R1 |
*106 (PPM/°C) |
| R1(T2-T1) |
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| R1: Resistance value at room
temperature (T1) |
| R2: Resistance value at room
temperature +100°C (T2) |
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Load life in humidity
(JIS-C-5202 7.9) |
Resistance change rate is +(5% +0.05Ω) max. with no evidence of mechanical damage. |
Resistance change after 1000Hrs
(1.5Hrs on, 0.5Hrs off) At rated voltage in a humidity chamber controlled at
40+2°C and 90-95% relative
humidity. |
Load life
(JIS-C-5202 7.10) |
Resistance change rate is +(5% +0.05Ω)max. with no evidence of mechanical damage. |
Resistance change after 1000Hrs
operating at rated voltage with duty cycle of 1.5Hrs on 0.5Hrs off at 70°C + 2°C. |
Short
time over load
(JIS-C-5202 5.5) |
+(1% + 0.05Ω) |
Resistance change after the application of a
potential of 2.5 time rated voltage for 5 second. |
Pulse
overload
(JIS-C-5202 5.8) |
Resistance change rate is +(2% + 0.05Ω)
max. with no evidence of mechnical damage. |
Resistance change after 10000 cycles (1 seconds
on. 25 seconds off) at 4 time rated voltage(AC) |
Humidity
(JIS-C-5202 7.4) |
Resistance change rate is +(2%+0.05Ω)Max. with no evidence of mechanical damage. |
Resistance change after 240hrs exposure in a
humidity test chamber controlled at 40+2°C and 90-95%
relative humidity. |
Resistance to soldering heat
(JIS-C-5202 6.4) |
Resistance change rate is +(1%+0.05Ω)Max. with no evidence of mechanical damage. |
Dipping both side of resistor copper wire 3.2mm to 4.8mm
according to the test method below: |
| Temperature |
DIP time |
| 350°C+10°C |
3.5+0.5sec. |
| 260°C+5°C |
10+1.0sec. |
Solderability
(JIS-C-5202 6.5) |
95% coverage minimum |
Test
temperature of solder: |
| 235+5°C |
| Dwell time in solder: 3+0.5 sec. |
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